Title :
A 10-bit low-power SAR ADC with a tunable series attenuation capacitor
Author :
Filipovic, Lado ; MacEachern, Leonard
Author_Institution :
Dept. of Electron., Carleton Univ., Ottawa, ON, Canada
Abstract :
A 10-bit successive approximation analog-to-digital converter (ADC), with offset correction circuitry and a tunable series attenuation capacitor is presented for implantable biosensor applications. The ADC is designed in a standard 0.13 ¿m CMOS process technology and can operate with supply voltages down to 0.6 V. The ADC uses MOSFETs that are designed to operate in the sub-threshold region of operation. The ADC achieved sample rates of up to 500 kS/s with all 1024 codes present and an INL and DNL of 0.1009LSB and 0.1429LSB respectively. A power dissipation of 20.9 pJ/cycle was measured, while operating at 100 kS/s, with a 0.6 V supply voltage and an INL and DNL of 0.2585LSB and 0.2862LSB respectively, with all codes present. With a 1.0 V VDD, a 320 kS/s signal achieved an INL and DNL of 0.1623LSB and 0.2858LSB, respectively, with all codes present. A series attenuation capacitor is used to reduce the size of the circuit. Since processing variations can change the value of this capacitor and degrade the ADC operation, it was designed to vary between 401.7 fF to 487.5 fF using five digital input bits. Without process variations, the optimal variable capacitor code was designed to be the middle code, ¿10000¿.
Keywords :
CMOS digital integrated circuits; analogue-digital conversion; capacitors; circuit tuning; codes; 10-bit low-power SAR ADC; 10-bit successive approximation analog-to-digital converter; CMOS process technology; MOSFETs; capacitance 401.7 fF to 487.5 fF; codes; offset correction circuitry; power dissipation; size 0.13 mum; sub-threshold operation region; tunable series attenuation capacitor; voltage 0.6 V; word length 10 bit; Analog-digital conversion; Attenuation; Biosensors; CMOS process; CMOS technology; Capacitors; MOSFETs; Power dissipation; Tunable circuits and devices; Voltage;
Conference_Titel :
Microelectronics, 2008. ICM 2008. International Conference on
Conference_Location :
Sharjah
Print_ISBN :
978-1-4244-2369-9
Electronic_ISBN :
978-1-4244-2370-5
DOI :
10.1109/ICM.2008.5393551