• DocumentCode
    3214436
  • Title

    Investigating issues of on-chip voltage regulator in nanoscale integrated circuits

  • Author

    Gjanci, Juliana ; Chowdhury, Masud

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of Illinois at Chicago, Chicago, IL, USA
  • fYear
    2008
  • fDate
    14-17 Dec. 2008
  • Firstpage
    123
  • Lastpage
    126
  • Abstract
    Voltage regulation in system-on-chip has turned into a very critical challenge for nanoscale IC designers. It is imperative that for multi-core implementation on-chip voltage regulator offers enormous benefits. This paper discusses the advantages and disadvantages of using on-chip regulators as well as their functional operation. Furthermore, it introduces the technique of using a hot swap controller along with an N-channel MOSFET to monitor and control the inrush current in the circuit, and reduce the voltage droop. Simulations show how the controller reduces the voltage droop in the circuit. Here, an overview of current technology and different types of regulators used in the design of micro- and nano-electronic systems is presented. Specific emphasis is given to switching regulators since they are the preferred topology for on-chip integration. The primary goal of this work is to identify the issues associated with on-chip regulators.
  • Keywords
    MOSFET circuits; integrated circuit design; nanoelectronics; switching circuits; system-on-chip; voltage regulators; hot swap controller; inrush current; microelectronic systems; n-channel MOSFET; nanoelectronic systems; nanoscale integrated circuits; on-chip voltage regulator; switching regulators; system-on-chip; voltage droop; Circuits; Control systems; Energy management; Frequency; Network-on-a-chip; Power system reliability; Regulators; Surges; System-on-a-chip; Voltage control; Hot-Swap Controller; Inrush Current; On-chip regulator; Voltage Droop;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microelectronics, 2008. ICM 2008. International Conference on
  • Conference_Location
    Sharjah
  • Print_ISBN
    978-1-4244-2369-9
  • Electronic_ISBN
    978-1-4244-2370-5
  • Type

    conf

  • DOI
    10.1109/ICM.2008.5393555
  • Filename
    5393555