Title :
Identification effort for local maps in a chaotic system
Author :
Lim, Eek ; Mareels, IMY
Author_Institution :
Dept. of Electr. & Electron. Eng., Melbourne Univ., Parkville, Vic., Australia
Abstract :
We investigate the identification effort required to obtain a local map in a chaotic attractor. The identification data length is estimated in terms of the available excitation, noise levels perturbing measurements and state transition, and the principle components describing the chaotic motion of the map in question
Keywords :
Markov processes; autoregressive moving average processes; chaos; continuous time systems; identification; nonlinear dynamical systems; probability; ARMA model; Markov chain; chaos; chaotic attractor; chaotic system; continuous time systems; identification; local map; noise levels; nonlinear dynamical systems; principle components; probability; state transition; Chaos; Extraterrestrial measurements; Length measurement; Motion control; Motion estimation; Motion measurement; Noise level; Noise measurement; State estimation; System identification;
Conference_Titel :
Decision and Control, 1997., Proceedings of the 36th IEEE Conference on
Conference_Location :
San Diego, CA
Print_ISBN :
0-7803-4187-2
DOI :
10.1109/CDC.1997.657909
