• DocumentCode
    321496
  • Title

    Development of voltage temperature curves specific to cell design

  • Author

    Hall, Stephen W. ; Brown, Harry M. ; Manzo, Michelle A.

  • Author_Institution
    Naval Surface Warfare Center, Crane, IN, USA
  • Volume
    1
  • fYear
    1997
  • fDate
    27 Jul-1 Aug 1997
  • Firstpage
    108
  • Abstract
    Testing at Crane Division Naval Surface Warfare Center on the new advanced Ni-Cd secondary cell designs showed that the standard V/T curves might not be applicable to all designs. Adjusting in 20 millivolt increments would sometimes result in either an under or over charged condition. To verify this potential problem, a program was establish to revisit V/Ts. The task was to define the maximum and minimum voltage window settings for each design and to establish a general rule for adjusting the C/D ratio. These curves were then used for the life cycling of the NASA Aerospace Ni-Cd Verification Test Program
  • Keywords
    aerospace testing; cadmium; nickel; secondary cells; space vehicle power plants; NASA Aerospace Ni-Cd Verification Test Program; Ni-Cd; Ni-Cd secondary batteries; aerospace batteries; charge/discharge ratio; design; electrochemical performance testing; life cycling; voltage window settings; voltage-temperature curves; Aerospace testing; Code standards; Cranes; Life testing; Low earth orbit satellites; Manufacturing; NASA; Road transportation; Temperature; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Energy Conversion Engineering Conference, 1997. IECEC-97., Proceedings of the 32nd Intersociety
  • Conference_Location
    Honolulu, HI
  • Print_ISBN
    0-7803-4515-0
  • Type

    conf

  • DOI
    10.1109/IECEC.1997.659168
  • Filename
    659168