Title :
A Literature Review of IGBT Fault Diagnostic and Protection Methods for Power Inverters
Author :
Lu, Bin ; Sharma, Santosh
Author_Institution :
Innovation Center, Eaton Corp., Milwaukee, WI
Abstract :
This paper presents a survey on existing methods for fault diagnosis and protection of IGBT´s, with special focus on those used in three-phase power inverters. Twenty one methods for open-circuit faults and ten methods for short-circuit faults are evaluated and summarized, based on their performance and implementation efforts. The gate-misfiring faults and their diagnostic methods are also briefly discussed. Finally, the promising methods are recommended for future work.
Keywords :
fault diagnosis; insulated gate bipolar transistors; invertors; short-circuit currents; IGBT fault diagnostic; fault protection; gate-misfiring faults; open-circuit faults; short-circuit faults; three-phase power inverters; DC generators; Fault detection; Fault diagnosis; Insulated gate bipolar transistors; Inverters; Protection; Switches; Thermal stresses; Torque; Voltage;
Conference_Titel :
Industry Applications Society Annual Meeting, 2008. IAS '08. IEEE
Conference_Location :
Edmonton, Alta.
Print_ISBN :
978-1-4244-2278-4
Electronic_ISBN :
0197-2618
DOI :
10.1109/08IAS.2008.349