Automatic TCXO frequency-temperature test chamber using thermoelectric device array [temperature compensated crystal oscillator]

Author

Shin, Kwang-Sig ; Chung, Wan-Young

Author_Institution

Graduate Sch., Dongseo Univ., Pusan, South Korea

Volume

3

fYear

2001

fDate

2001

Firstpage

1624

Abstract

An automatic temperature compensated crystal oscillator (TCXO) frequency-temperature test apparatus was developed using a thermoelectric device array. The developed system swings stably the test temperature range from -40°C to 80°C for about 1 hour. The rising temperature ratio was fairly linear with time in this test temperature range. The temperature could be controlled in an error range of ±0.05°C in this system. The developed system could be used for measuring the accuracy of frequency-temperature properties of TCXO or the thermoelectric properties of other electronic devices

Keywords

automatic test equipment; crystal oscillators; test facilities; thermal analysis; thermoelectric devices; -40 to 80 C; 1 h; automatic TCXO frequency-temperature test chamber; frequency-temperature properties measurement; rising temperature ratio; temperature compensated crystal oscillator; test temperature range; thermoelectric device array; Automatic testing; Control systems; Error correction; Frequency measurement; Oscillators; System testing; Temperature control; Temperature distribution; Thermoelectric devices; Thermoelectricity;

fLanguage

English

Publisher

ieee

Conference_Titel

Industrial Electronics, 2001. Proceedings. ISIE 2001. IEEE International Symposium on

Conference_Location

Pusan

Print_ISBN

0-7803-7090-2

Type

conf

DOI

10.1109/ISIE.2001.931950

Filename

931950