Title :
Some results on feature detection using residual analysis
Author :
Chen, Ming-Hua ; Lee, David ; Pavlidis, Theo
Author_Institution :
Dept. of Electr. Eng., State Univ. of New York, Stony Brook, NY, USA
Abstract :
Images are considered as consisting of three parts: features, noise, and smooth components. After a smoothing operation, the difference between the result and the original image has the characteristics of noise in areas away from features. Systematic trends in the difference indicate features such as edges, corners, or textures. It is shown that the autocorrelation function of the residuals takes specific forms when computed along various paths, and in particular along a circle or a disk centered at a zero crossing of residuals. Then, feature detection is reduced to classifying the autocorrelation profile. An implementation of this technique is described
Keywords :
correlation methods; filtering and prediction theory; pattern recognition; autocorrelation function; circle; corners; disk; edges; feature detection; noise; residual analysis; smoothing; textures; Autocorrelation; Computer vision; Filters; Image analysis; Image edge detection; Image recognition; Laboratories; Machine vision; Numerical analysis; Smoothing methods;
Conference_Titel :
Pattern Recognition, 1990. Proceedings., 10th International Conference on
Conference_Location :
Atlantic City, NJ
Print_ISBN :
0-8186-2062-5
DOI :
10.1109/ICPR.1990.118187