DocumentCode :
3215751
Title :
Reachability analysis using partitioned-ROBDDs
Author :
Narayan, A. ; Isles, A.J. ; Jain, J. ; Brayton, R.K. ; Sangiovanni-Vincentelli, A.L.
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., California Univ., Berkeley, CA, USA
fYear :
1997
fDate :
9-13 Nov. 1997
Firstpage :
388
Lastpage :
393
Abstract :
We address the problem of finite state machine (FSM) traversal, a key step in most sequential verification and synthesis algorithms. We propose the use of partitioned ROBDDs to reduce the memory explosion problem associated with symbolic state space exploration techniques. In our technique, the reachable state set is represented as a partitioned ROBDD (A. Narayan et al., 1996). Different partitions of the Boolean space are allowed to have different variable orderings and only one partition needs to be in memory at any given time. We show the effectiveness of our approach on a set of ISCAS89 benchmark circuits. Our techniques result in a significant reduction in total memory utilization. For a given memory limit, partitioned ROBDD based method can complete traversal for many circuits for which monolithic ROBDDs fail. For circuits where both partitioned ROBDDs as well as monolithic ROBDDs cannot complete traversal, partitioned ROBDDs can reach a significantly larger set of states.
Keywords :
circuit analysis computing; directed graphs; finite state machines; reachability analysis; sequential circuits; Boolean space; ISCAS89 benchmark circuits; Reduced Ordered Binary Decision Diagrams; finite state machine traversal; memory explosion problem; memory limit; monolithic ROBDDs; partitioned ROBDD based method; partitioned ROBDDs; reachability analysis; reachable state set; sequential verification; symbolic state space exploration techniques; synthesis algorithms; total memory utilization; variable orderings; Circuit simulation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer-Aided Design, 1997. Digest of Technical Papers., 1997 IEEE/ACM International Conference on
Conference_Location :
San Jose, CA, USA
ISSN :
1092-3152
Print_ISBN :
0-8186-8200-0
Type :
conf
DOI :
10.1109/ICCAD.1997.643565
Filename :
643565
Link To Document :
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