DocumentCode
3215800
Title
Power Quality Investigation of Surge Protective Device Failures During Open-Transition for a Waste Water Treatment Facility
Author
Dionise, Thomas J. ; El-Mahayni, Rakan
Author_Institution
EESS- Power Syst. Eng., Eaton Corp., Warrendale, PA
fYear
2008
fDate
5-9 Oct. 2008
Firstpage
1
Lastpage
6
Abstract
To date, many papers have been written about various concepts in power system grounding explaining application, advantages and disadvantages of each of the solidly, resistance and ungrounded systems. The purpose of this paper is not to explain the theory behind the aforementioned concepts, rather, substantiate them with actual field measurements during a failure of a surge protective device. The measurements taken utilizing digital power quality monitors, and subsequent analysis, will demonstrate the adverse effect of arcing ground faults on ungrounded systems as system voltages escalate to undesirable values. The paper will then examine high resistance grounding as a superior solution from a service continuity perspective with a beneficial dampening effect on high-voltage transients that exist on ungrounded systems during arcing ground faults. Consequently, the paper will discuss the operational precautions that the end user must be aware of before proceeding with the implementation of a high-resistance-grounding scheme.
Keywords
arcs (electric); earthing; fault diagnosis; power supply quality; surge protection; wastewater treatment; arcing ground faults; dampening effect; field measurements; high-resistance-grounding scheme; high-voltage transients; open-transition; power quality; power system grounding; service continuity perspective; surge protective device failures; waste water treatment facility; Electrical resistance measurement; Grounding; Power measurement; Power quality; Power system measurements; Power system protection; Power system transients; Surge Protective Devices - c62; Voltage; Wastewater treatment;
fLanguage
English
Publisher
ieee
Conference_Titel
Industry Applications Society Annual Meeting, 2008. IAS '08. IEEE
Conference_Location
Edmonton, Alta.
ISSN
0197-2618
Print_ISBN
978-1-4244-2278-4
Electronic_ISBN
0197-2618
Type
conf
DOI
10.1109/08IAS.2008.371
Filename
4659159
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