Title :
Modeling Of The Frequency Dependent C-V Characteristics Of Neutron Irradiated P+-n Silicon Detectors After The Type Inversion In The Space Charge Region
Author_Institution :
Brookhaven National Laboratory
fDate :
31 Oct-6 Nov 1993
Keywords :
Capacitance-voltage characteristics; Conductivity; Frequency dependence; Laboratories; Neutrons; Radiation detectors; Silicon; Space charge; Thyristors; Voltage;
Conference_Titel :
Nuclear Science Symposium and Medical Imaging Conference, 1993., 1993 IEEE Conference Record.
Print_ISBN :
0-7803-1487-5
DOI :
10.1109/NSSMIC.1993.701701
