Effects of scanning and biasing circuit restructuring on the response of a large area magnetic field sensor array

A large area magnetic field sensor array has been designed and fabricated with built-in redundancy using the laser-link technology as a restructuring tool. The sensor system response is measured and calibrated with a general regression analysis method. An algorithm to evaluate the effects of the restructuring schemes of the biasing and scanning circuits on the response is presented. From these first results, influence of the biasing circuit on the sensitivity of the sensor system is established and modification in the post-processing technique to reduce chip damage are required