DocumentCode
3216086
Title
A Mal-Trip of Bus Relay Due to Visible Light
Author
Wu, Li-Cheng ; Liu, Chih-Wen
Author_Institution
Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei
fYear
2008
fDate
5-9 Oct. 2008
Firstpage
1
Lastpage
4
Abstract
In the power industry, bus bars are key components for electrical energy collections. The key components usually use bus relay for their protection. However, the bus relay occurred with mal-trip by itself. The problem will cause load with voltage interrupted when the power system is healthful. This paper will introduce a special case of bus relay mal-trip due to visible light interference.
Keywords
busbars; interference; light; relay protection; Kirchhoff law; bus bars; bus relay mal-trip; steady state magnetic field test; transfer function; visible light interference; Circuit testing; IEC standards; Interference; Magnetic fields; Power system protection; Power system relaying; Protective relaying; Rectifiers; Relays; Steady-state;
fLanguage
English
Publisher
ieee
Conference_Titel
Industry Applications Society Annual Meeting, 2008. IAS '08. IEEE
Conference_Location
Edmonton, Alta.
ISSN
0197-2618
Print_ISBN
978-1-4244-2278-4
Electronic_ISBN
0197-2618
Type
conf
DOI
10.1109/08IAS.2008.385
Filename
4659173
Link To Document