Title :
A Mal-Trip of Bus Relay Due to Visible Light
Author :
Wu, Li-Cheng ; Liu, Chih-Wen
Author_Institution :
Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei
Abstract :
In the power industry, bus bars are key components for electrical energy collections. The key components usually use bus relay for their protection. However, the bus relay occurred with mal-trip by itself. The problem will cause load with voltage interrupted when the power system is healthful. This paper will introduce a special case of bus relay mal-trip due to visible light interference.
Keywords :
busbars; interference; light; relay protection; Kirchhoff law; bus bars; bus relay mal-trip; steady state magnetic field test; transfer function; visible light interference; Circuit testing; IEC standards; Interference; Magnetic fields; Power system protection; Power system relaying; Protective relaying; Rectifiers; Relays; Steady-state;
Conference_Titel :
Industry Applications Society Annual Meeting, 2008. IAS '08. IEEE
Conference_Location :
Edmonton, Alta.
Print_ISBN :
978-1-4244-2278-4
Electronic_ISBN :
0197-2618
DOI :
10.1109/08IAS.2008.385
