Title :
Virtual chromosome modeling for learning human cytogenetics
Author :
Yang, Xiaoli ; Wu, Wei ; Wen, Ding ; Chen, Bin ; Lacny, Jason ; Tseng, Charles
Author_Institution :
Dept. of Electr. & Comput. Eng., Purdue Univ. Calumet, Hammond, IN, USA
Abstract :
The G-banding technique is routinely used for generating characteristic banding patterns for chromosome identification and karyotyping. Since G-band patterns are not static, training cytogenetics technologists to master the skills of chromosome analysis is a long process. Furthermore, the opportunities for biology students to access a wide range of different chromosome aberrations for practice are limited. To increase the resource for analyzing normal and abnormal human chromosomes, we hereby introduce an image processing and recognition method to create virtual chromosomes for education purposes at universities and clinical laboratories. While maintaining the entire characteristic features of digitized G-banded chromosomes from prepared microscope slides, the newly developed virtual chromosome modeling system is dynamic with the capability of changing shapes and creating certain chromosome abnormalities such as deletions in association with diseases including cancers. The virtual chromosomes will also provide a foundation for developing chromosome based genetics learning program linking both transmission and molecular genetics.
Keywords :
biomedical education; cellular biophysics; computer aided instruction; educational institutions; genetics; image recognition; medical computing; G- banded chromosome; G-band pattern; G-banding technique; characteristic banding pattern; chromosome identification; clinical laboratory; genetics learning program; human chromosome analysis; image processing method; image recognition method; karyotyping; learning human cytogenetics; virtual chromosome modeling system; Biological cells; Biological system modeling; Character generation; Educational institutions; Genetics; Humans; Image analysis; Image processing; Image recognition; Pattern analysis; chromosome modeling; image processing; pattern recognition;
Conference_Titel :
Control and Automation (ICCA), 2010 8th IEEE International Conference on
Conference_Location :
Xiamen
Print_ISBN :
978-1-4244-5195-1
Electronic_ISBN :
1948-3449
DOI :
10.1109/ICCA.2010.5524141