DocumentCode :
3216519
Title :
End-to-end analysis using MICHELLE and TESLA codes
Author :
Chernyavskiy, I.A. ; Vlasov, A.N. ; Petillo, J.J. ; Wright, E.L. ; Levush, B.
Author_Institution :
SAIC, McLean, VA, USA
fYear :
2009
fDate :
1-5 June 2009
Firstpage :
1
Lastpage :
1
Abstract :
The 2.5D large-signal code TESLA is capable of accurate and efficient modeling of linear-beam vacuum electronic amplifiers, such as klystrons and multiple-beam klystrons (MBKs), extended interaction klystrons (EIKs), inductive output tubes (IOTs) and coupled cavity traveling-wave tubes (CC-TWTs). The demanding computational accuracy in the designs of modern vacuum amplifiers requires a monolithic approach in the modeling of the entire device, so called "end-to-end analysis". In this work we will report a new approach to perform such analysis. This approach is based on using the gun-collector code MICHELLE and the latest version of the code TESLA. We added in TESLA the capability to import and process detailed electron beam distributions given by the gun-code MICHELLE. The given initial distribution of particles can be de-populated to keep their total number reasonably low to take advantage of the performance advantages of the TESLA model. After the TESLA large-signal simulation, the spent-beam information can be exported back into MICHELLE to perform the collector simulation. To support currently available time-dependent simulations by MICHELLE we are working to include in TESLA the time-dependent electron beam data processing as well. We will show TESLA simulations of a few different devices with electron beam distributions imported from the gun-code.
Keywords :
amplifiers; codes; electron beams; vacuum microelectronics; TESLA codes; collector simulation; coupled cavity traveling-wave tubes; electron beam distribution; end-to-end analysis; extended interaction klystron; gun-collector MICHELLE code; inductive output tubes; large-signal simulation; linear-beam vacuum electronic amplifier; monolithic approach; multiple-beam klystron; time-dependent electron beam data processing; time-dependent simulation; Electron beams; Electron devices; Electron tubes; Klystrons; Laboratories; Optical coupling; Performance analysis; Plasma devices; Plasma simulation; USA Councils;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Plasma Science - Abstracts, 2009. ICOPS 2009. IEEE International Conference on
Conference_Location :
San Diego, CA
ISSN :
0730-9244
Print_ISBN :
978-1-4244-2617-1
Type :
conf
DOI :
10.1109/PLASMA.2009.5227554
Filename :
5227554
Link To Document :
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