Cold-test characteristics simulation of a v-type microstrip meander-line slow wave structure

Author

Fei Shen ; Yan-yu Wei ; Zhao-yun Duan ; Wen-xiang Wang ; Yu-bin Gong

Author_Institution

Vacuum Electron. Nat. Lab., Univ. of Electron. Sci. & Technol. of China, Chengdu, China

fYear

2010

fDate

14-16 Oct. 2010

Firstpage

288

Lastpage

289

Abstract

In this paper, a novel v-type microstrip meander-line slow wave structure (MMSWS) is presented. With the electromagnetic simulation software HFSS, the comparisons of the dispersion characteristic and coupling impedance between the novel and traditional MMSWS are given. Then the cold-test characteristics of the v-type structure for different parameters are calculated. Also, the structure supported by dielectric slab is analyzed. The results demonstrate that the v-type structure has a better performance than the traditional in both bandwidth and coupling impedance, while the structure supported by dielectric slab has an even better performance than the former.

Keywords

dispersion (wave); microstrip lines; slow wave structures; HFSS electromagnetic simulation software; V-type microstrip meander-line slow wave structure; cold-test characteristics simulation; coupling impedance; dielectric slab; dispersion characteristic; Dispersion; Vacuum technology;

fLanguage

English

Publisher

ieee

Conference_Titel

Vacuum Electron Sources Conference and Nanocarbon (IVESC), 2010 8th International

Conference_Location

Nanjing

Print_ISBN

978-1-4244-6645-0

Type

conf

DOI

10.1109/IVESC.2010.5644218

Filename

5644218