DocumentCode :
3216543
Title :
Design of accelerated reliability tests based on simple-step-stress model
Author :
Takemoto, Yasuhiko ; Arizono, Ikuo
Author_Institution :
Osaka Prefecture Univ., Japan
fYear :
2003
fDate :
2003
Firstpage :
111
Lastpage :
116
Abstract :
The accelerated life tests can obtain information on lifetime characteristics of products quickly. Then, the products can be submitted to higher levels of stress in various ways such as constant, step, and progress stress. In a constant-stress model, products are run under a constant level of stress until all products fail or a time limit is reached. A step-stress model allows the stress setting to be changed at a prescribed time or upon the occurrence of a fixed number of failures. In a progress-stress model, the stress is continuously increased over time. Until now, under the assumption of the functional relationship between the parameters of lifetime distribution and applied stress, there are many studies about parameter estimation using data obtained from an accelerated life test. In this study, instead of the parameter estimate problem, the authors consider a new design procedure of accelerated life tests based on the simple-step-stress model for assuring the mean time to failure (MTTF) at usual stress with specified producer and consumer risks under the condition that the parameters of the lifetime distribution at two stress levels are provided. The practical usage of the proposed design procedure is illustrated through some numerical examples.
Keywords :
failure analysis; life testing; product development; reliability; accelerated life tests; accelerated reliability tests design; applied stress parameters; constant-stress model; design procedure; lifetime distribution parameters; mean time to failure; product lifetime characteristics; progress-stress model; simple-step-stress model; Life estimation; Life testing; Lifetime estimation; Parameter estimation; Sampling methods; Shape; Stress; Weibull distribution;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability and Maintainability Symposium, 2003. Annual
ISSN :
0149-144X
Print_ISBN :
0-7803-7717-6
Type :
conf
DOI :
10.1109/RAMS.2003.1181911
Filename :
1181911
Link To Document :
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