Title :
Semiconductor manufacturing equipment data acquisition simulation for timing performance analysis
Author :
Ya-Shian Li-Baboud ; Xiao Zhu ; Anand, D. ; Hussaini, S. ; Moyne, J.
Author_Institution :
Semicond. Electron. Div., Nat. Inst. of Stand. & Technol., Gaithersburg, MD
Abstract :
The ability to acquire quality equipment and process data is important for future real-time process control systems to maximize opportunities for semiconductor manufacturing yield enhancement and equipment efficiency. Clock synchronization for accurate time-stamping and maintaining a consistent frequency in trace data collection are essential for accurate merging of data from heterogeneous sources. To characterize the factors impacting data collection synchronization and performance, a configurable fab-wide equipment data acquisition (EDA) simulator has been developed. By understanding the factors impacting clock synchronization and accurate time-stamping, the simulator is used to identify and explore methods to mitigate the latencies and provide guidance on accurate time-stamping for equipment data acquisition systems.
Keywords :
data acquisition; process control; semiconductor device manufacture; clock synchronization; configurable fab-wide equipment data acquisition; real-time process control systems; semiconductor manufacturing equipment data acquisition simulation; timing performance analysis; Computational modeling; Data models; Delay; Production facilities; Servers; Switches; Synchronization; Equipment Data Acquisition standard; data acquisition; data quality; semiconductor manufacturing; time synchronization;
Conference_Titel :
Precision Clock Synchronization for Measurement, Control and Communication, 2008. ISPCS 2008. IEEE International Symposium on
Conference_Location :
Ann Arbor, MI
Print_ISBN :
978-1-4244-2274-6
DOI :
10.1109/ISPCS.2008.4659217