• DocumentCode
    321661
  • Title

    Analysis of thin-strip scatterer by MEI

  • Author

    Luo, Y.L. ; Luk, K.M. ; Mei, K.K. ; Yung, E.K.N.

  • Author_Institution
    Dept. of Electron. Eng., City Univ. of Hong kong, Hong Kong
  • Volume
    1
  • fYear
    1997
  • fDate
    2-5 Dec 1997
  • Firstpage
    473
  • Abstract
    MEI (Measured Equation of Invariance) has been applied to solve many kinds of electromagnetic radiation and scattering problems. In this paper, we are concerned with the MEI solution and singularity when it is used to analyze scattering problem of metallic thin-strip scatterers. In our analysis, a conformal mesh is employed. A 6-point MEI is used to find the truncation boundary condition. The singularity of MEI exists in the vicinity of the ends of a two-dimensional thin-strip scatterer. For mesh nodes in vicinity of the ends of the thin-strip scatterer, values of the measuring function are very close for the different metrics used. This will result in the ill-conditioning of MEI and MEI coefficients. In this paper, we show this phenomena and our measurement for dealing with such a problem. Numerical results are obtained to compare with those obtained by the Method of Moments
  • Keywords
    electromagnetic wave scattering; numerical analysis; 6-point MEI; EM radiation scattering; MEI singularity; conformal mesh; measured equation of invariance; mesh nodes; metallic thin-strip; thin-strip scatterer; truncation boundary condition; two-dimensional scatterer; Antenna measurements; Boundary conditions; Dielectric measurements; Electric variables measurement; Electromagnetic measurements; Electromagnetic radiation; Electromagnetic scattering; Equations; Moment methods; Termination of employment;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Conference Proceedings, 1997. APMC '97, 1997 Asia-Pacific
  • Print_ISBN
    962-442-117-X
  • Type

    conf

  • DOI
    10.1109/APMC.1997.659426
  • Filename
    659426