Title :
Automatic generation of diagnostic expert systems from fault trees
Author :
Assaf, Tariq ; Dugan, Joanne Bechta
Author_Institution :
Virginia Univ., Charlottesville, VA, USA
Abstract :
When a fault tolerant computer-based system fails, diagnosis and repair must be performed to bring the system back to an operational state. The use of fault tolerance design implies that several components or subsystems may have failed, and that perhaps many of these faults have been tolerated before the system actually succumbed to failure. Diagnosis procedures are then needed to determine the most likely source of failure and to guide repair actions. Expert systems are often used to guide diagnostics, but the derivation of an expert system requires knowledge (i.e., a conceptual model) of failure symptoms. In this paper, we consider the problem of diagnosing a system for which there may be little experience, given that it might be a one-of-a-kind system or because access to the system may be limited. We conjecture that the same fault tree model used to help aid in the design and analysis of the system can provide the conceptual model of system component interactions needed in order to define a diagnostic process. We explore the use of a fault tree model (along with the probabilities of failure for the basic events) along with partial knowledge of the state of the system (i.e., the system has failed, and perhaps some components are known to be operational or failed) to produce a diagnostic aid.
Keywords :
binary decision diagrams; diagnostic expert systems; failure analysis; fault tolerant computing; fault trees; binary decision diagrams; diagnostic expert systems automatic generation; expert systems; failure probabilities; fault tolerance design; fault tolerant computer-based system; fault tree model; fault trees; importance factors; repair; Boolean functions; Data structures; Diagnostic expert systems; Fault diagnosis; Fault tolerant systems; Fault trees; Glass; International Space Station; Process design; Testing;
Conference_Titel :
Reliability and Maintainability Symposium, 2003. Annual
Print_ISBN :
0-7803-7717-6
DOI :
10.1109/RAMS.2003.1181916