DocumentCode :
3216660
Title :
Time-to-failure tree
Author :
Ejlali, Alireza ; Miremadi, Seyyed Ghasem
Author_Institution :
Sharif Univ. of Technol., Tehran, Iran
fYear :
2003
fDate :
2003
Firstpage :
148
Lastpage :
152
Abstract :
The reliability analysis of critical systems is often performed using fault tree analysis. Fault trees are analyzed using analytic approaches or Monte Carlo simulation. The usage of the analytic approaches is limited in few models and certain kinds of parameter distributions. In contrast to the analytic approaches, Monte Carlo simulation can be broadly used. However, Monte Carlo simulation is time-consuming because of the intensive computation. In this paper, a new model is presented which is called time-to-failure tree. Static and dynamic fault trees can be easily transformed into time-to-failure trees. In fact, each time-to-failure tree is a digital circuit, which can be synthesized to a field programmable gate array (FPGA). Therefore, Monte Carlo simulation can be significantly accelerated using FPGAs.
Keywords :
fault trees; field programmable gate arrays; reliability; FPGA; Monte Carlo simulation; critical systems; digital circuit; dynamic fault trees; fault tree analysis; field programmable gate array; parameter distributions; reliability analysis; static fault trees; time-to-failure tree; Acceleration; Analytical models; Circuit synthesis; Computational modeling; Digital circuits; Failure analysis; Fault trees; Field programmable gate arrays; Humans; Performance analysis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability and Maintainability Symposium, 2003. Annual
ISSN :
0149-144X
Print_ISBN :
0-7803-7717-6
Type :
conf
DOI :
10.1109/RAMS.2003.1181917
Filename :
1181917
Link To Document :
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