DocumentCode :
3216839
Title :
Effect of substrate pretreatment on the field emission property of nano-amorphous carbon film
Author :
Zhang Xinyue ; Fu Tao ; Yao Ning ; Zeng Fanguang ; Zhang Bing lin
Author_Institution :
Zhengzhou Inst. of Aeronaut. Ind. Manage., Zhengzhou, China
fYear :
2010
fDate :
14-16 Oct. 2010
Firstpage :
508
Lastpage :
509
Abstract :
In this paper, nano-amorphous carbon films were synthesized on Si substrates by microwave plasma enhances chemical vapor deposition (MPCVD). In order to improve its field emission properties, prior to the deposition of thin films, substrates were first mechanically polished, especially investigated the influence of polishing process of substrates on field emission of the nano-amorphous carbon films were especially investigated. Silicon substrate was used as substrate for the synthesis of the nano-amorphous carbon films; with its area of 1 cm . The source gas for growing films was a mixture of H2 and CH4, The typical gas flow rates of H2 and CH4 were 100 seem and 10 seem, respectively, with total pressure of 5.0x103Pa. The substrate temperature was maintained at 700°C. The deposition time was kept for 3 hour. Two various samples of a and b were prepared, sample a of a un-pretreated silicon plate, and the substrate of sample with mechanically polished by SiC polishing powders, with the diameter of 20μm respectively.
Keywords :
amorphous state; carbon; electron field emission; plasma CVD; polishing; surface roughness; C; MPCVD; Si; Si substrates; field emission property; gas flow rates; microwave plasma enhances chemical vapor deposition; nanoamorphous carbon films; size 20 mum; substrate mechanical polishing; substrate pretreatment; temperature 700 degC; thin film deposition; time 3 h; unpretreated silicon plate;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Vacuum Electron Sources Conference and Nanocarbon (IVESC), 2010 8th International
Conference_Location :
Nanjing
Print_ISBN :
978-1-4244-6645-0
Type :
conf
DOI :
10.1109/IVESC.2010.5644231
Filename :
5644231
Link To Document :
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