• DocumentCode
    3216918
  • Title

    Electron-phonon and electron-defect scattering rates in semiconducting zigzag carbon nanotubes

  • Author

    Thiagarajan, K. ; Lindefelt, U.

  • Author_Institution
    Dept. of Inf. Technol. & Media, Mid Sweden Univ., Sundsvall, Sweden
  • fYear
    2010
  • fDate
    14-16 Oct. 2010
  • Firstpage
    282
  • Lastpage
    283
  • Abstract
    The electron transport properties of single walled carbon nanotubes are of fundamental importance for the development of carbon based nanotechnology. Carbon nanotubes can display both chemical and structural defects, which affect electronic states near the Fermi level. This is further complicated by the fact that the concentration of defects depends upon the method of synthesis. In this work, we have investigated both electron-phonon and electron-defect scattering in semiconducting zigzag carbon nanotubes by calculating and analyzing the quantum-mechanical scattering rates for these processes. One objective of this work is to give a theoretical limit for the concentration of defects at which electron-defect scattering rates would be comparable to the electron-phonon scattering rates.
  • Keywords
    carbon nanotubes; electron-phonon interactions; elemental semiconductors; quantum theory; semiconductor nanotubes; C; Fermi level; carbon based nanotechnology; chemical defect; defect concentration; electron transport properties; electron-defect scattering rate; electron-phonon scattering rate; electronic states; quantum-mechanical scattering rates; semiconducting zigzag carbon nanotubes; single walled carbon nanotubes; structural defect; Electron tubes;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Vacuum Electron Sources Conference and Nanocarbon (IVESC), 2010 8th International
  • Conference_Location
    Nanjing
  • Print_ISBN
    978-1-4244-6645-0
  • Type

    conf

  • DOI
    10.1109/IVESC.2010.5644235
  • Filename
    5644235