DocumentCode
3216918
Title
Electron-phonon and electron-defect scattering rates in semiconducting zigzag carbon nanotubes
Author
Thiagarajan, K. ; Lindefelt, U.
Author_Institution
Dept. of Inf. Technol. & Media, Mid Sweden Univ., Sundsvall, Sweden
fYear
2010
fDate
14-16 Oct. 2010
Firstpage
282
Lastpage
283
Abstract
The electron transport properties of single walled carbon nanotubes are of fundamental importance for the development of carbon based nanotechnology. Carbon nanotubes can display both chemical and structural defects, which affect electronic states near the Fermi level. This is further complicated by the fact that the concentration of defects depends upon the method of synthesis. In this work, we have investigated both electron-phonon and electron-defect scattering in semiconducting zigzag carbon nanotubes by calculating and analyzing the quantum-mechanical scattering rates for these processes. One objective of this work is to give a theoretical limit for the concentration of defects at which electron-defect scattering rates would be comparable to the electron-phonon scattering rates.
Keywords
carbon nanotubes; electron-phonon interactions; elemental semiconductors; quantum theory; semiconductor nanotubes; C; Fermi level; carbon based nanotechnology; chemical defect; defect concentration; electron transport properties; electron-defect scattering rate; electron-phonon scattering rate; electronic states; quantum-mechanical scattering rates; semiconducting zigzag carbon nanotubes; single walled carbon nanotubes; structural defect; Electron tubes;
fLanguage
English
Publisher
ieee
Conference_Titel
Vacuum Electron Sources Conference and Nanocarbon (IVESC), 2010 8th International
Conference_Location
Nanjing
Print_ISBN
978-1-4244-6645-0
Type
conf
DOI
10.1109/IVESC.2010.5644235
Filename
5644235
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