Title :
Detection of myocardial ischemia episode using morphological features
Author :
Cheng-Hsiang Fan ; Yu Hsu ; Sung-Nien Yu ; Jou-Wei Lin
Author_Institution :
Dept. of Electr. Eng. with High-tech Innovations, Nat. Chung Cheng Univ., Chiayi, Taiwan
Abstract :
In this study, we propose to use morphological features that are easy to identify to differentiate myocardial ischemic beats from normal beats. In general, myocardial ischemia causes alterations in electrocardiographic (ECG) signal such as deviation in the ST segment. When the ST segment level deviates from a certain voltage, the beat would be diagnosing as myocardial ischemia. To emphasize on ST variations, the QRS complex of the ECG signal was first subtracted and replaced with a straight line. Five-level discrete wavelet transform (DWT) followed to decompose the waveform into subband components and the A5 subband, which is most sensitive to the changes in the ST segment, was reconstructed for the calculation of 12 morphological features. The support vector machine (SVM) and the 10-fold cross-validation method were employed to evaluate the performance of the method. The results show high values of 95.20%, 93.29%, and, 93.63% in sensitivity, specificity, and accuracy, respectively, that were demonstrated to outperform the other methods in the literature.
Keywords :
bioelectric potentials; discrete wavelet transforms; diseases; electrocardiography; feature extraction; medical signal detection; medical signal processing; support vector machines; QRS complex; ST segment level deviation; ST segment reconstruction; electrocardiographic signal; five-level discrete wavelet transform; morphological feature calculation; myocardial ischemia episode detection; myocardial ischemic beat differentiation; subband component; support vector machine; ten-fold cross-validation method; Databases; Discrete wavelet transforms; Electrocardiography; Feature extraction; Myocardium; Sensitivity; Support vector machines;
Conference_Titel :
Engineering in Medicine and Biology Society (EMBC), 2013 35th Annual International Conference of the IEEE
Conference_Location :
Osaka
DOI :
10.1109/EMBC.2013.6611252