Title :
Correlation between the output signals from a dual polarized antenna
Author :
Nilsson, M. ; Lindmark, B.
Author_Institution :
Allgon Syst. AB, Taby, Sweden
Abstract :
Dual polarized antennas are traditionally characterized in terms of a port-to-port isolation co-polar and cross-polar patterns. We identify the critical parameter when the antenna is used as as sensor in a polarization diversity reception system. This turns out to be the far-field coupling between the two channels, the inverse of which characterizes the orthogonality of the channels. We derive an expression for the power correlation between the outputs of a dual polarized antenna when used in different environments. The expression is used to analyze two ideal antenna types: a dual polarized aperture coupled patch element and a pair of orthogonal slanted dipoles, both over an infinite ground plane. Both antennas have /spl plusmn/45/spl deg/ linear polarizations, which is preferable since they provide identical azimuth patterns and equal mean power. We show that under Gaussian assumptions about the incident fields, the far-field coupling provides valuable insight to the correlation between the output signals from the two channels of a dual polarized antenna.
Keywords :
antenna radiation patterns; correlation methods; dipole antennas; diversity reception; electromagnetic wave polarisation; microstrip antennas; Gaussian assumptions; aperture coupled patch element; azimuth patterns; co-polar patterns; cross-polar patterns; dual polarized antenna; far-field coupling; incident fields; infinite ground plane; linear polarization; mean power; orthogonal channels; orthogonal slanted dipoles; output signals; polarization diversity reception system; port-to-port isolation; power correlation; sensor; Art; Covariance matrix; Directive antennas; Isolation technology; Microwave technology; Polarization; Reactive power; Receiving antennas; Space stations; Vectors;
Conference_Titel :
Antennas and Propagation Society International Symposium, 1998. IEEE
Conference_Location :
Atlanta, GA, USA
Print_ISBN :
0-7803-4478-2
DOI :
10.1109/APS.1998.701708