DocumentCode
3217864
Title
Grafting of a copper(II) Schiff base complex on functionalized multi-wall carbon nanotubes (MWNTs)
Author
Salavati-Niasari, M. ; Davar, F.
Author_Institution
IEEE Conference Publishing, Piscataway, NJ, USA
fYear
2010
fDate
14-16 Oct. 2010
Firstpage
447
Lastpage
448
Abstract
The use of carbon nanotubes (CNTs) and other carbon materials as support for homogeneous catalysts is an untapped area, despite of their broad use as catalysts and as supports for metals in its reduced state. Conversely, CNTs present several advantages when compared to inorganic supports; they are thermally stable, resistant to chemical attack in acid and basic media [1,2]. In the present study, hydroxyl functionalized copper(II) Schiff-base; [Cu((OH)2-salophen)], [(OH)2-salophen] = (N,N´-bis(4-hydroxysalicylidene)phenylene-1,2-diamine); has been covalently anchored on modified multi-wall carbon nanotubes (MWNTs); [Cu((OH)2-salophen)]@MWNTs. The new modified MWNTs have been characterized by transmission electron microscopy (TEM), X-ray diffraction (XRD), X-ray photoelectron (XPS), thermogravimetric analysis (TGA), ultraviolet-visible (UV-Vis) spectroscopy, Diffuse reflectance (DRS), FT-IR spectroscopy and elemental analysis.
Keywords
Fourier transform spectra; X-ray diffraction; X-ray photoelectron spectra; carbon nanotubes; catalysts; copper compounds; infrared spectra; thermal analysis; transmission electron microscopy; ultraviolet spectra; visible spectra; (N,N´-bis(4-hydroxysalicylidene)phenylene-1,2-diamine); C; Diffuse reflectance; FTIR spectroscopy; X-ray diffraction; X-ray photoelectron spectra; [Cu((OH)2-salophen)] [(OH)2-salophen]; chemical attack; copper(II) Schiff base complex; elemental analysis; functionalized multi-wall carbon nanotubes; homogeneous catalysts; inorganic supports; thermally stable material; thermogravimetric analysis; transmission electron microscopy; ultraviolet-visible spectroscopy;
fLanguage
English
Publisher
ieee
Conference_Titel
Vacuum Electron Sources Conference and Nanocarbon (IVESC), 2010 8th International
Conference_Location
Nanjing
Print_ISBN
978-1-4244-6645-0
Type
conf
DOI
10.1109/IVESC.2010.5644281
Filename
5644281
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