Title :
Enhanced electron field emission from carbon nanotubes irradiated by energetic C ions
Author :
Peng-cheng Sun ; Jian-hua Deng ; Zhao-xia Ping ; Guo-an Cheng ; Rui-ting Zheng
Author_Institution :
Key Lab. of Beam Technol. & Mater. Modification of Minist. of Educ., Beijing Normal Univ., Beijing, China
Abstract :
In this paper, the investigation on the electron field emission enhancement from carbon nanotubes irradiated by energetic C ions are reported. Multiwalled carbon nanotube arrays (MW-CNTAs) are synthesized on (100) silicon substrates by a thermal chemical vapor deposition (TCVD) at 750°C for 30 min. In this procedure, a Fe thin film with a thickness of 5 nm is used as a catalyst, and the mixing of hydrogen and acetylene with a H2/C2H2 flow rate ratio of 3.3:1 is used as a reactive source. Energetic C ion irradiation is carried out by MEVVA ion implanter. The incidence angle of the ions is about 45°, and the average energy of C ions is about 40keV. The irradiation doses are 5.6x1016, 9.6x1016, 2.3x1017, 3.4x1017 and 5.6x1017 respectively. Scanning electron microscopy (SEM), transmission electron microscopy (TEM), X-ray photoelectron spectra (XPS) and Raman are used to characterize the structures of as-grown and the irradiated CNTs. Field emission measurement is carried out in a bipolar measurement equipment with a base pressure of 1x10-7Pa at room temperature.
Keywords :
Raman spectra; X-ray photoelectron spectra; carbon nanotubes; chemical vapour deposition; electron field emission; ion beam effects; ion implantation; nanofabrication; scanning electron microscopy; transmission electron microscopy; (100) silicon substrates; C; MEVVA ion implanter; Raman spectra; SEM; Si; TEM; X-ray photoelectron spectra; XPS; bipolar measurement; carbon ion implantation; carbon ion irradiation; carbon nanotubes; electron field emission; iron thin film catalyst; pressure 0.0000001 Pa; scanning electron microscopy; size 5 nm; temperature 293 K to 298 K; temperature 750 degC; thermal chemical vapor deposition; time 30 min; transmission electron microscopy;
Conference_Titel :
Vacuum Electron Sources Conference and Nanocarbon (IVESC), 2010 8th International
Conference_Location :
Nanjing
Print_ISBN :
978-1-4244-6645-0
DOI :
10.1109/IVESC.2010.5644285