• DocumentCode
    3217999
  • Title

    Technical evaluation of two 6-kW mono-Si photovoltaic systems at the National Renewable Energy Laboratory

  • Author

    Van Dyk, E. Ernest ; Strand, Troy ; Hansen, Robert

  • Author_Institution
    Nat. Renewable Energy Lab., Golden, CO, USA
  • fYear
    1996
  • fDate
    13-17 May 1996
  • Firstpage
    1533
  • Lastpage
    1536
  • Abstract
    This paper presents an analysis of performance data on the two 6-kWAC grid-connected photovoltaic systems at the National Renewable Energy Laboratory (NREL). The performance parameters analyzed include DC and AC power, aperture efficiency, energy, capacity factor and performance index which are compared to plane-of-array irradiance, ambient temperature, and back-of-module temperature as a function of time, either daily or monthly. Power ratings of the systems were also obtained for data corresponding to different test conditions. This study has shown, in addition to expected seasonal trends, that system monitoring is a valuable tool in assessing performance and detecting faulty equipment. In addition, methods applied for this study may be used to evaluate and compare systems employing different cell technologies
  • Keywords
    elemental semiconductors; photovoltaic power systems; silicon; solar cell arrays; solar cells; 6 kW; AC power; DC power; NREL; National Renewable Energy Laboratory; Si; ambient temperature; aperture efficiency; back-of-module temperature; capacity factor; energy; faulty equipment detection; grid-connected photovoltaic systems; mono-Si photovoltaic systems; performance index; plane-of-array irradiance; power ratings; roof mounted solar arrays; technical evaluation; Apertures; Data analysis; Fault detection; Laboratories; Performance analysis; Photovoltaic systems; Renewable energy resources; Solar power generation; System testing; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference, 1996., Conference Record of the Twenty Fifth IEEE
  • Conference_Location
    Washington, DC
  • ISSN
    0160-8371
  • Print_ISBN
    0-7803-3166-4
  • Type

    conf

  • DOI
    10.1109/PVSC.1996.564429
  • Filename
    564429