DocumentCode :
3218119
Title :
Effect of changing the MCP´s bias angle on resolution of image intensifier
Author :
Wang, Yannan ; Yang, G.W. ; Chang, B.K.
Author_Institution :
Inst. of Electron. Eng. & Optoelectron. Technol., Nanjing Univ. of Sci. & Technol., Nanjing, China
fYear :
2010
fDate :
14-16 Oct. 2010
Firstpage :
244
Lastpage :
246
Abstract :
This paper studies the impact of MCP´s bias angle on the resolution of image intensifier. To analyze this we obtain the mathematical expression of voltage at every point by resolving the Laplace equation with the finite difference method. Then, we substitute values to the mathematical expression and calculate the voltage in discrete points until the error less than a certain value with the over-relaxation method. Secondly, with the voltage distribution, we compute the distribution of equipotential lines with the trajectory tracing method and calculate the electron trajectories by Hechtel method. Finally, the line spread function is calculated from the placement distribution on the phosphor of the electron trajectories. Then the MTF at the different spatial frequency on the phosphor is gained by the line spread function for Fourier transform.
Keywords :
Fourier transform optics; Laplace equations; finite difference methods; microchannel plates; optical resolving power; optical transfer function; Fourier transform; Hechtel method; Laplace equation; finite difference method; image intensifier; line spread function; microchannel plate; modulation transfer function; optical resolution; over-relaxation method; trajectory tracing method; Image resolution; Optical reflection;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Vacuum Electron Sources Conference and Nanocarbon (IVESC), 2010 8th International
Conference_Location :
Nanjing
Print_ISBN :
978-1-4244-6645-0
Type :
conf
DOI :
10.1109/IVESC.2010.5644295
Filename :
5644295
Link To Document :
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