• DocumentCode
    3218157
  • Title

    RF power loss, local electric and magnetic field enhancement due to surface roughness

  • Author

    Peng Zhang ; Lau, Y.Y. ; Gilgenbach, R.M.

  • Author_Institution
    Dept. of Nucl. Eng. & Radiol. Sci., Univ. of Michigan, Ann Arbor, MI, USA
  • fYear
    2009
  • fDate
    1-5 June 2009
  • Firstpage
    1
  • Lastpage
    1
  • Abstract
    Surface roughness plays an important role in a cavity or slow wave structure. It may cause enhanced RF power absorption. It may lead to excessive local electric field enhancement that triggers RF breakdown. In a superconducting cavity, surface roughness may also cause local magnetic field enhancement that leads to abrupt quenching, i.e., rapid loss of superconductivity. In this work, we analytically compute the power absorption due to a hemispherical protrusion on a resonant cavity´s surface. The local field enhancement factors of both electric field and magnetic field on the protrusion are also calculated analytically. This protrusion may represent a foreign object since its permittivity ??, permeability ?? and conductivity ?? may take on arbitrary values. Scaling laws are derived.
  • Keywords
    electromagnetic wave absorption; plasma waves; slow wave structures; superconducting cavity resonators; surface electromagnetic waves; surface roughness; RF breakdown; RF power loss; conductivity; electric field enhancement; enhanced RF power absorption; field enhancement factor; hemispherical protrusion; magnetic field enhancement; permeability; permittivity; resonant cavity; scaling law; slow wave structure; superconducting cavity; superconductivity; surface roughness; Absorption; Electric breakdown; Magnetic analysis; Magnetic fields; Magnetic resonance; Radio frequency; Rough surfaces; Superconductivity; Surface roughness; Surface waves;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Plasma Science - Abstracts, 2009. ICOPS 2009. IEEE International Conference on
  • Conference_Location
    San Diego, CA
  • ISSN
    0730-9244
  • Print_ISBN
    978-1-4244-2617-1
  • Type

    conf

  • DOI
    10.1109/PLASMA.2009.5227628
  • Filename
    5227628