Title :
Fabrication of cold test system for slow-wave structure
Author :
Zhaojun Zhu ; Baofu Jia ; Deming Wan ; Chaolei Wei ; Wang Jian
Author_Institution :
Sch. of Phys. Electron., UESTC of China, Chengdu, China
Abstract :
Dispersion characteristics and interaction impedance is the key parameter for travelling wave tube design. This paper demonstrate the travelling wave tube method for dispersion test. A helix slow wave structure was chosen as sample for test validation. Also, the test results are compared with the simulations of CST Microwave Studio (MWS) and High Frequency Structure Simulator (HFSS). Test results for the dispersion and the interaction impedance were shown.
Keywords :
computational electromagnetics; electromagnetic wave scattering; slow wave structures; testing; CST Microwave Studio; High Frequency Structure Simulator; cold test system; dispersion characteristics; helix slow wave structure; interaction impedance; travelling wave tube method;
Conference_Titel :
Vacuum Electron Sources Conference and Nanocarbon (IVESC), 2010 8th International
Conference_Location :
Nanjing
Print_ISBN :
978-1-4244-6645-0
DOI :
10.1109/IVESC.2010.5644309
