DocumentCode
3218605
Title
Effect of surface charge trapping in dielectric barrier discharge
Author
Li, C.R. ; Li, M. ; Zhan, H.M. ; Wang, X.X.
Author_Institution
Beijing Key Lab. of High Voltage & EMC, North China Electr. Power Univ., Beijing, China
fYear
2009
fDate
1-5 June 2009
Firstpage
1
Lastpage
1
Abstract
Summary form only given. The experiment of dielectric barrier discharge in a 2-mm air gap shows that the pressure range of a uniform discharge using polytetrafluoroethylene as barrier is much wider than that using quartz or alumina. The parameters of the charge trapped on the surface of these three dielectric barriers were obtained by surface charge measurement and thermally stimulated current measurement. It was found that surface charge trapping has much influence on the uniform discharge, i.e., the seed electrons necessary for uniform discharge may be produced by the desorption of the absorbed electrons in the shallow trap with energy level lower than 1 eV. Results from scanning electron microscopy, Fourier transform infrared spectroscopy and the measurement of thermally stimulated current show that a high density of the physical defects and the chemical defects are introduced into the surface of the silicone rubber plates after they are treated by corona discharge plasma. These defects behave electrically as shallow electron traps, leading to the formation of a uniform discharge in air at higher pressure when the corona-modified silicone rubber is used in dielectric barrier discharge.
Keywords
Fourier transform spectra; corona; desorption; discharges (electric); electron traps; energy states; infrared spectra; polymers; scanning electron microscopy; silicone rubber; surface charging; Fourier transform infrared spectroscopy; alumina; chemical defects; corona discharge plasma; desorption; dielectric barrier discharge; energy level; physical defects; polytetrafluoroethylene; quartz; scanning electron microscopy; shallow electron traps; silicone rubber plates; surface charge trapping; thermally stimulated current measurement; Charge measurement; Current measurement; Dielectrics; Electron traps; Energy states; Fourier transforms; Plasma measurements; Rubber; Scanning electron microscopy; Surface discharges;
fLanguage
English
Publisher
ieee
Conference_Titel
Plasma Science - Abstracts, 2009. ICOPS 2009. IEEE International Conference on
Conference_Location
San Diego, CA
ISSN
0730-9244
Print_ISBN
978-1-4244-2617-1
Type
conf
DOI
10.1109/PLASMA.2009.5227647
Filename
5227647
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