• DocumentCode
    3218713
  • Title

    Comparison of reliability enhancement tests for electronic equipment

  • Author

    Kearney, Michael ; Marshall, Jane ; Newman, Bob

  • Author_Institution
    Sch. of Electron. & Phys. Sci., Surrey Univ., Guildford, UK
  • fYear
    2003
  • fDate
    2003
  • Firstpage
    435
  • Lastpage
    440
  • Abstract
    Techniques for fast and effective reliability enhancement testing of electronic equipment intended for use in harsh operating environments have been investigated. In particular, studies have been made of (i) a step-stress, swept-sine on random vibration profile (with combined thermal/humidity cycling) test, and (ii) a variety of tests utilising rapid thermal cycling and tri-axis vibration. The methodology is based on using established products, namely aerospace engine transient pressure units and automotive engine management units, for which considerable field reliability data exists, to assess the effectiveness of the tests at finding relevant faults. Our principal conclusions are as follows: (i) combining test variables is more effective than using them in isolation, (ii) tri-axis vibration can lead to relevant failures very quickly provided the test is well designed and (iii) rapid thermal cycling is not particularly useful for products of the type studied here.
  • Keywords
    automotive electronics; dynamic testing; electronic equipment testing; pressure measurement; pressure sensors; reliability; thermal analysis; aerospace engine transient pressure units; automotive engine management units; electronic equipment; field reliability data; harsh operating environments; rapid thermal cycling test; reliability enhancement tests; step-stress swept-sine on random vibration profile test; thermal/humidity cycling; tri-axis vibration test; Aerospace testing; Automotive engineering; Diesel engines; Diffusion tensor imaging; Electronic equipment; Electronic equipment testing; Humidity; Life estimation; Life testing; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability and Maintainability Symposium, 2003. Annual
  • ISSN
    0149-144X
  • Print_ISBN
    0-7803-7717-6
  • Type

    conf

  • DOI
    10.1109/RAMS.2003.1182028
  • Filename
    1182028