DocumentCode
3218740
Title
Co-axial 2D Bragg structures for a high-power free electron maser
Author
Konoplev, I.V. ; Cross, A.W. ; Phelps, A.D.R. ; Ronald, K. ; McGrane, P.
Author_Institution
Dept. of Phys., Strathclyde Univ., Glasgow, UK
fYear
2004
fDate
27-29 April 2004
Firstpage
188
Lastpage
189
Abstract
A coaxial 2D Bragg structure can be obtained by machining the corrugation on the surfaces of either inner or outer conductors of a coaxial waveguide which can be presented as r(z,φ) = Rin,out+a1cos(kzz)cos(mφ), where Rin,out are the radii of inner ("in") and outer ("out") conductors, a1 is the amplitude of the corrugation, kz=2π/dz and dz is the period of the corrugation along the longitudinal coordinate z and m is the corrugation variation number along the azimuthal coordinate φ. Taking into account the small perturbations of the waveguide surfaces, the RF field inside the 2D Bragg structure can be considered as a superposition of four partial waves. Using the code MAGIC, the RF field scattering on the corrugation has been studied and indirect coupling between incident and reflected waves has been demonstrated. In recent experiments, an annular electron beam of diameter 7 cm with electron energy of up to 450 keV and beam current up to 1.6 kA has been measured. An efficiency of ∼15% has been predicted for the FEM with a 2D Bragg cavity. The immediate goal of the experiment is to generate ∼100 MW of power at an operating frequency of 37.5 GHz.
Keywords
Bragg gratings; coaxial waveguides; electromagnetic wave scattering; electron beams; electronic engineering computing; free electron lasers; masers; millimetre wave lasers; radiowave propagation; 1.6 kA; 100 MW; 15 percent; 2D Bragg cavity FEM; 2D Bragg structure RF field; 37.5 GHz; 450 keV; 7 cm; MAGIC code; RF field scattering; annular electron beam diameter; beam current; coaxial 2D Bragg structure; coaxial waveguide; electron energy; high-power free electron maser; incident waves; indirect coupling; inner conductors; machining; operating frequency; outer conductors; reflected waves; surface corrugation; waveguide surface perturbations; Coaxial components; Conductors; Corrugated surfaces; Electron beams; Machining; Masers; Radio frequency; Scattering; Surface waves; Waveguide components;
fLanguage
English
Publisher
ieee
Conference_Titel
Vacuum Electronics Conference, 2004. IVEC 2004. Fifth IEEE International
Print_ISBN
0-7803-8261-7
Type
conf
DOI
10.1109/IVELEC.2004.1316265
Filename
1316265
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