Title :
A novel voltage-controlled ring oscillator based on nanoscale DG-MOSFETs
Author :
Kaya, Savas ; Kulkarni, Anish
Author_Institution :
Sch. of EE&CS, Ohio Univ., Athens, OH, USA
Abstract :
Equipped with two closely coupled channels, double gate (DG) MOSFETs can locally and dynamically alter the front gate threshold by an applied back-gate bias in independent drive (IDDG) configuration. We illustrate in this paper how a conventional ring oscillator built using odd-number of CMOS inverters could be transformed to a robust, compact and high-sensitivity voltage-controlled oscillator (VCO) using this back gate tuning property. We explore the main design parameters of this VCO and analyze its tuning and jitter characteristics using SPICE simulations. The single or dual-biasing schemes explored here show that the nanoscale IDDG-MOSFETs are especially rewarding candidates for novel VCO/ICO circuitry targeted for low-power and compact systems.
Keywords :
CMOS analogue integrated circuits; MOSFET; SPICE; circuit tuning; invertors; jitter; nanoelectronics; semiconductor device models; voltage-controlled oscillators; CMOS inverters; SPICE simulations; VCO; applied back-gate bias; back gate tuning property; compact voltage-controlled oscillator; double gate MOSFETs; dual-biasing scheme; front gate threshold; high-sensitivity voltage-controlled oscillator; independent drive configuration; jitter characteristics; nanoscale IDDG-MOSFETs; robust voltage-controlled oscillator; single-biasing scheme; tuning characteristics; voltage-controlled ring oscillator; Analytical models; Circuit optimization; Inverters; Jitter; MOSFETs; Ring oscillators; Robustness; SPICE; Tuning; Voltage-controlled oscillators; DG-MOSFETs; Nanocircuits; Ring Oscillator; VCO; jitter;
Conference_Titel :
Microelectronics, 2008. ICM 2008. International Conference on
Conference_Location :
Sharjah
Print_ISBN :
978-1-4244-2369-9
Electronic_ISBN :
978-1-4244-2370-5
DOI :
10.1109/ICM.2008.5393792