DocumentCode
3219099
Title
Automatic Generation of Test Sets for SBST of Microprocessor IP Cores
Author
Sanchez, E. ; Reorda, M. Sonza ; Squillero, G. ; Violante, M.
Author_Institution
Politecnico di Torino, Dip. di Automatica e Informatica, Corso Duca degli Abruzzi 24. 10129, Torino, Italy. Tel: +39-011564.7092, Fax: +39-011564.7099, edgar.sanchez@polito.it
fYear
2005
fDate
4-7 Sept. 2005
Firstpage
74
Lastpage
79
Abstract
Higher integration densities, smaller feature lengths, and other technology advances, as well as architectural evolution, have made microprocessor cores exceptionally complex. Currently, Software-Based Self-Test (SBST) is becoming an attractive test solution since it guarantees high fault coverage figures, runs at-speed, and matches core test requirements while exploiting low-cost ATEs. However, automatically generating test programs is still an open problem. This paper presents a novel approach for test program generation, that couples evolutionary techniques with hardware acceleration. The methodology was evaluated targeting a 5-stage pipelined processor implementing a SPARCv8 micro-processor core.
Keywords
Assembly; Automatic testing; Built-in self-test; Circuit testing; Design automation; Hardware; Life estimation; Microprocessors; Performance evaluation; Software testing; Algorithms; Automatic Test Generation; Design; Experimentation; FPGA; Hardware Accelerator; Microprocessor Test; Performance; Pipelined Architectures; Test programs; Verification;
fLanguage
English
Publisher
ieee
Conference_Titel
Integrated Circuits and Systems Design, 18th Symposium on
Print_ISBN
1-59593-174-0
Type
conf
DOI
10.1109/SBCCI.2005.4286835
Filename
4286835
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