• DocumentCode
    3219471
  • Title

    Field emission properties of quantum dots

  • Author

    Gordeev, S.K. ; Sheshin, Evgeny P. ; Shornikova, A.L.

  • Author_Institution
    Central Res. Inst. for Mater., St. Petersburg, Russia
  • fYear
    2010
  • fDate
    14-16 Oct. 2010
  • Firstpage
    73
  • Lastpage
    73
  • Abstract
    In this work were investigated on field-emission properties of the so-called quantum dots. Field emission is an emission of electrons induced by external electromagnetic fields. This is the only form of emission, which does not require the preliminary electron excitation. Before the experiment the surface of the sample was processed in several stages. Sample was placed into the vacuum system and connected according to the diode circuit. Voltage was supplied to the anode, and current in the system was measured. After the end of the experiment the sample was re-examined in a scanning electron microscope. From the data the following graphs were built: the voltage-current characteristics before and after experiment; the dependence of current on the time; graph in Fowler-Nordheim coordinates; the dependence of the current on tension. As it can be seen from the graphs of this material shows good field emission properties and lower threshold voltage and lower currents than other carbon materials. Based on the results of experiment man can conclude that QDs can be used for making the planar field emission cathodes. It has lower threshold voltage in comparison with the other carbonic structures.
  • Keywords
    electromagnetic fields; electron field emission; quantum dots; scanning electron microscopy; Fowler-Nordheim coordinate; diode circuit; external electromagnetic field; field electron emission; quantum dot; scanning electron microscopy; threshold voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Vacuum Electron Sources Conference and Nanocarbon (IVESC), 2010 8th International
  • Conference_Location
    Nanjing
  • Print_ISBN
    978-1-4244-6645-0
  • Type

    conf

  • DOI
    10.1109/IVESC.2010.5644364
  • Filename
    5644364