Title :
Performance analysis of a 10-Gbit/s digital switch on MCM
Author :
Truzzi, Claudio ; Beyne, Eric ; Ringoot, Edwin
Author_Institution :
IMEC, Leuven, Belgium
Abstract :
The paper describes a test device realised as an MCM including four identical unencapsulated ASICs mounted on a 5-layer thin-film substrate. The MCM is a 12.8 Gbit/sec data switch and it has been designed with the purpose of performance evaluation of the module interconnection technology. A validation methodology has been developed to highlight the effect of variables such as line properties, switching noise, crosstalk and buffer topologies on the signal integrity. This approach has been used to characterise the transmission rate of the digital switch and to evaluate the system performance of the interconnection technology
Keywords :
application specific integrated circuits; crosstalk; data communication equipment; digital communication; digital integrated circuits; integrated circuit interconnections; integrated circuit layout; multichip modules; switching circuits; 10 to 12.8 Gbit/s; 5-layer thin-film substrate; MCM; buffer topologies; crosstalk; data switch; digital switch; line properties; module interconnection technology; performance analysis; signal integrity; switching noise; transmission rate characterisation; unencapsulated ASICs; validation methodology; Application specific integrated circuits; Computational modeling; Crosstalk; Frequency; Integrated circuit interconnections; Performance analysis; Signal design; Substrates; Switches; Testing;
Conference_Titel :
Innovative Systems in Silicon, 1996. Proceedings., Eighth Annual IEEE International Conference on
Conference_Location :
Austin, TX
Print_ISBN :
0-7803-3639-9
DOI :
10.1109/ICISS.1996.552431
