DocumentCode :
3219618
Title :
A physical DC model of short channel MOS transistor using trapezoidal Gaussian surface
Author :
Chaisirithavornkul, Weerayoot ; Kasemsuwan, Varakom
Author_Institution :
Fac. of Eng., King Mongkut´´s Inst. of Technol., Bangkok, Thailand
fYear :
2000
fDate :
2000
Firstpage :
24
Lastpage :
28
Abstract :
A physical DC model for short channel MOSFET is presented. The model accounts for several second order effects including the vertical and horizontal mobility degradations, velocity saturation, and the channel length modulation. Accurate electric widths at the saturation point and the drain field around the drain end is obtained through the quasi two dimensional approximation (QTDA) using Gaussian surface with trapezoidal shape. The theoretical predictions of the model show good agreement with experimental data available in the literature over a wide range of biasing conditions
Keywords :
Gaussian distribution; MOSFET; carrier mobility; electric fields; electric resistance; semiconductor device models; Gaussian surface; QTDA; biasing conditions; channel length modulation; drain end; drain field; electric widths; horizontal mobility degradation; model; physical DC model; quasi two dimensional approximation; saturation point; second order effects; short channel MOS transistor; short channel MOSFET; trapezoidal Gaussian surface; velocity saturation; vertical mobility degradation; Degradation; Electric resistance; Electron traps; MOS devices; MOSFET circuits; Microprocessors; Predictive models; Shape; Surface resistance; Threshold voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Semiconductor Electronics, 2000. Proceedings. ICSE 2000. IEEE International Conference on
Conference_Location :
Guoman Port Dickson Resort
Print_ISBN :
0-7803-6430-9
Type :
conf
DOI :
10.1109/SMELEC.2000.932300
Filename :
932300
Link To Document :
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