Title :
Cross Talk Coupling, a Tool to Characterize Electromagnetic Immunity of Integrated Circuits
Author :
Bazzoli, S. ; Slimen, N. Ben ; Kone, L. ; Demoulin, B.
Author_Institution :
Groupe TELICE du DHS-IEMN, Univ. des Sci. et Technol. de Lille, Cedex
Abstract :
The paper deals with use of cross talk coupling throughout transmission lines in order to determine electromagnetic sensitivity of integrated circuits. Some experimental data will be proposed to point out the relationship between occurrence of the resonance on the line and non linear effects due to ESD clamping diode placed at IC´s input. To conclude some details are brought to extend cross talk data to the general case of the lines under plane wave radiation
Keywords :
crosstalk; electromagnetic compatibility; immunity testing; integrated circuit testing; ESD clamping diode; cross talk coupling; electromagnetic immunity; electromagnetic sensitivity; integrated circuits; transmission lines; Cables; Coupling circuits; Distributed parameter circuits; Electromagnetic compatibility; Electromagnetic coupling; Electrostatic discharge; Frequency; Resonance; Transmission line theory; Voltage;
Conference_Titel :
Electronics Systemintegration Technology Conference, 2006. 1st
Conference_Location :
Dresden
Print_ISBN :
1-4244-0552-1
Electronic_ISBN :
1-4244-0553-x
DOI :
10.1109/ESTC.2006.280003
