Title :
A novel circuit diagnostic technique using electro-optic sampling
Author :
Wakana, S. ; Ozaki, K. ; Sekiguchi, H. ; Goto, Y. ; Umehara, Y. ; Matsumoto, J.
Author_Institution :
Fujitsu Labs. Ltd., Kanagawa, Japan
Abstract :
We have developed a novel probing system for internal node diagnostics. This probe uses an electro-optic sampling technique. It has sub-/spl mu/m spatial resolution, a few mV voltage resolution and 100 ps temporal resolution. The prototype system has a measurement bandwidth of 3 GHz.
Keywords :
MMIC; UHF integrated circuits; UHF measurement; electro-optical devices; integrated circuit testing; microwave measurement; probes; signal sampling; 100 ps; 3 GHz; IC testing; circuit diagnostic technique; electro-optic sampling; internal node diagnostics; probing system; submicron spatial resolution; Circuit testing; Control systems; Integrated circuit measurements; Laboratories; Position measurement; Probes; Spatial resolution; Surface topography; System performance; Voltage measurement;
Conference_Titel :
Microwave Photonics, 1996. MWP '96. Technical Digest., 1996 Internatonal Topical Meeting on
Conference_Location :
Kyoto, Japan
Print_ISBN :
0-7803-3129-X
DOI :
10.1109/MWP.1996.662114
