Title :
Proceedings Sixth Asian Test Symposium (ATS´97)
Abstract :
The following topics are dealt with: test generation; design for testability; fault tolerance; DFT techniques; Japanese industry; test technologies; mixed-signal test; logic optimisation; decision diagrams; FPGA test; software test; circuit diagnosis; delay test; BIST; and electric current testing
Keywords :
logic testing; BIST; DFT techniques; FPGA test; Japanese industry; circuit diagnosis; decision diagrams; delay test; design for testability; electric current testing; fault tolerance; logic optimisation; logic testing; mixed-signal test; software test; test generation;
Conference_Titel :
Test Symposium, 1997. (ATS '97) Proceedings., Sixth Asian
Conference_Location :
Akita, Japan
Print_ISBN :
0-8186-8209-4
DOI :
10.1109/ATS.1997.643900
