DocumentCode :
3220094
Title :
Acceleration charge sensitivity in AT-quartz resonators
Author :
Anderson, C.L. ; Bagby, J.S. ; Barrett, R.L. ; Ungvichian, V.
Author_Institution :
Motorola Inc., Tempe, AZ, USA
fYear :
1995
fDate :
31 May-2 Jun 1995
Firstpage :
519
Lastpage :
529
Abstract :
The behavior of AT-quartz resonators subject to acceleration is studied. For an AT-strip resonator with cantilever mounting, piezoelectric theory predicts that excitation of the pure lowest frequency flexural mode of vibration generates no charge. However, experiments show electromechanical resonance corresponding to this mode for sinusoidal support motion normal to the plane of the crystal with no applied electric field. An amplifier with a voltage follower first stage senses charge output from the crystal. Shielding is required to reduce sixty hertz and drive frequency electromagnetic interference. Measurement of resonant frequency and damping factor for the lowest frequency flexural mode is reported for a group of 17.76 MHz oscillator crystals. This mode is responsible for crystal breakage in some portable communications products. Significant variation in sensitivity among crystals was observed. Charge sensitivity of this mode is attributed in part to mechanical coupling to other modes involving torsion and lateral flexure
Keywords :
acceleration; crystal resonators; quartz; 17.76 MHz; AT-strip quartz resonators; SiO2; acceleration charge sensitivity; amplifier; cantilever mounting; crystal breakage; crystal oscillators; damping factor; electromagnetic interference; electromechanical resonance; flexural modes; lateral flexure; mechanical coupling; piezoelectric theory; portable communications products; resonant frequency; shielding; torsion; vibrations; Acceleration; Crystals; Damping; Electromagnetic interference; Electromagnetic measurements; Frequency measurement; Resonance; Resonant frequency; Vibrations; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Frequency Control Symposium, 1995. 49th., Proceedings of the 1995 IEEE International
Conference_Location :
San Francisco, CA
Print_ISBN :
0-7803-2500-1
Type :
conf
DOI :
10.1109/FREQ.1995.484048
Filename :
484048
Link To Document :
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