• DocumentCode
    3220101
  • Title

    On the compaction of test sets produced by genetic optimization

  • Author

    Pomeranz, Irith ; Reddy, Sudhakar M.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Iowa Univ., Iowa City, IA, USA
  • fYear
    1997
  • fDate
    17-19 Nov 1997
  • Firstpage
    4
  • Lastpage
    9
  • Abstract
    A previously proposed test generation procedure based on genetic optimization proved to have several advantages in terms of fault coverage; however, it produced large test set sizes. We investigate a way to generate compact test sets using this procedure by embedding it into a test compaction procedure. The compaction procedure constructs a compact test set out of the best tests contained in several test sets produced by the genetic optimization based test generation procedure. Using this approach, it is possible to significantly reduce the test set sizes obtained
  • Keywords
    automatic test equipment; fault diagnosis; genetic algorithms; iterative methods; embedding; fault coverage; genetic optimization; iterations; test generation; test set sizes; test sets compaction; Benchmark testing; Circuit faults; Circuit testing; Cities and towns; Compaction; Distributed power generation; Electrical fault detection; Fault detection; Genetic engineering; Tin;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Symposium, 1997. (ATS '97) Proceedings., Sixth Asian
  • Conference_Location
    Akita
  • ISSN
    1081-7735
  • Print_ISBN
    0-8186-8209-4
  • Type

    conf

  • DOI
    10.1109/ATS.1997.643906
  • Filename
    643906