Title :
Automatic testability analysis of boards and MCMs at chip level
Author :
Perbost, Marc ; Le Lan, L. ; Landrault, Christian
Author_Institution :
Dassault Electonique, France
Abstract :
Minimising the testing costs of boards and MCMs implies to invest in testability analysis in addition to the use of testing standards (IEEE 1149). In this paper, we propose a testability analysis method for boards and MCMs designed at Dassault Electronique. The actual prototype realised according to this new methodology aims at helping testability expert
Keywords :
IEEE standards; circuit analysis computing; design for testability; diagnostic expert systems; measurement standards; minimisation; multichip modules; printed circuit testing; Dassault Electronique; IEEE 1149; MCM; PROLOG; automatic testability analysis; chip level; expert system; minimisation; testing costs; testing standards; Automatic testing; Built-in self-test; Control systems; Costs; Hardware; Performance analysis; Performance evaluation; Probes; Prototypes; System testing;
Conference_Titel :
Test Symposium, 1997. (ATS '97) Proceedings., Sixth Asian
Conference_Location :
Akita
Print_ISBN :
0-8186-8209-4
DOI :
10.1109/ATS.1997.643913
