Title :
New superfast power closing switched-dynistors on delayed ionization
Author :
Efanov, V.M. ; Kardo-Sysoev, A.F. ; Tchashnikov, I.G. ; Yarin, P.M.
Author_Institution :
A.F. Ioffe Physicotech. Inst., Acad. of Sci., St. Petersburg, Russia
Abstract :
The fastest from known semiconductor electrically triggered power closing switches have turn on times of dozens of nanoseconds at ~1 kV blocking voltage and ~100 A switching current. Any attempt to increase the device voltage leads to an increase of the device thickness and an increase of turn-on times. Spark gaps, although faster, have severely limited lifetimes. The effect of delayed ionization has allowed for the development of a new kind of power superfast switch-silicon avalanche shapers (SAS)-in which time of flight limitation on speed has bean overcome. This approach has been used to develop new power superfast devices-fast ionization dynistors (FID)-which behave like a thyristor in that they have two steady states: nonconducting; and high-conducting. The fast (less than 1 ns) transition from the nonconducting to high-conducting state is induced by delayed ionization by the application of a short (nanosecond) high-voltage (kilovolts) pulse to the blocking p-n junction of the multilayered n+pnp+ semiconductor structure. Due to regenerative feedback, as in usual thyristors, the structure remains in the high-conducting state infinitely. To switch on the device, it is necessary to break the current by using an external circuit
Keywords :
ionisation; p-n heterojunctions; power semiconductor switches; pulsed power switches; blocking voltage; delayed ionization; fast ionization dynistors; pulsed power semiconductor switch; silicon avalanche shapers; superfast power closing switched-dynistors; switching current; Delay effects; Ionization; P-n junctions; Power semiconductor switches; Spark gaps; State feedback; Steady-state; Switching circuits; Thyristors; Voltage;
Conference_Titel :
Power Modulator Symposium, 1996., Twenty-Second International
Conference_Location :
Boca Raton, FL
Print_ISBN :
0-7803-3076-5
DOI :
10.1109/MODSYM.1996.564440