DocumentCode :
3220242
Title :
A genetic algorithm for the computation of initialization sequences for synchronous sequential circuits
Author :
Corno, E. ; Prinetto, P. ; Rebaudengo, M. ; Reorda, M. Soma ; Squillero, G.
Author_Institution :
Dipt. di Autom. e Inf., Politecnico di Torino, Italy
fYear :
1997
fDate :
17-19 Nov 1997
Firstpage :
56
Lastpage :
61
Abstract :
Testing circuits which do not include a global reset signal requires either complex ATPG algorithms based on 9- or even 256-valued algebras, or some suitable method to generate initialization sequences. This paper follows the latter approach, and presents a new method to the automated generation of an initialization sequence for synchronous sequential circuits. We propose a Genetic Algorithm providing a sequence that aims at initializing the highest number of flip flops with the lowest number of vectors. The experimental results show that the approach is feasible to be applied even to the largest benchmark circuits and that it compares well to other known approaches in terms of initialized flip flops and sequence length. Finally, this paper shows how the initialization sequences can be fruitfully exploited by simplifying the ATPG process
Keywords :
automatic test software; genetic algorithms; logic testing; sequential circuits; software performance evaluation; benchmark; benchmark circuits; complex ATPG algorithms; fitness function; genetic algorithm; global reset signal; heuristic operator; initialization sequences; synchronous sequential circuits; testing circuits; Automatic test pattern generation; Boolean functions; Circuit simulation; Circuit testing; Computational modeling; Data structures; Genetic algorithms; Sequential analysis; Sequential circuits; Synchronous generators;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Symposium, 1997. (ATS '97) Proceedings., Sixth Asian
Conference_Location :
Akita
ISSN :
1081-7735
Print_ISBN :
0-8186-8209-4
Type :
conf
DOI :
10.1109/ATS.1997.643917
Filename :
643917
Link To Document :
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