Title :
TEMPLATES: a test generation procedure for synchronous sequential circuits
Author :
Pomeranz, Irith ; Reddy, Sudhakar M.
Author_Institution :
Dept. of Electr. & Comput. Eng., Iowa Univ., Iowa City, IA, USA
Abstract :
We develop the basic definitions and procedures for a test generation concept referred to as templates that magnifies the effectiveness of test generation by taking advantage of the fact that many faults have “similar” test sequences. Once a template is generated, several test sequences to detect different faults are derived from it at a reduced complexity compared to the complexity of test generation
Keywords :
automatic testing; finite state machines; logic testing; sequential circuits; software performance evaluation; complexity; effectiveness; finite state machines; synchronous sequential circuits; template; test generation; test sequences; Circuit faults; Circuit testing; Cities and towns; Electrical fault detection; Fault detection; Sequential analysis; Sequential circuits; Synchronous generators;
Conference_Titel :
Test Symposium, 1997. (ATS '97) Proceedings., Sixth Asian
Conference_Location :
Akita
Print_ISBN :
0-8186-8209-4
DOI :
10.1109/ATS.1997.643923
