Design and implementation of strongly code disjoint CMOS built-in intermediate voltage sensor for totally self-checking circuits

Author

Pang, J.C.W. ; Wong, Mike W T ; Lee, Y.S.

Author_Institution

Dept. of Electron. Eng., Hong Kong Polytech., Hung Hom, Hong Kong

fYear

1997

fDate

17-19 Nov 1997

Firstpage

82

Lastpage

87

Abstract

This paper presents a new approach to implement a strongly code-disjoint CMOS built-in intermediate voltage sensor(BIVS). The function of the BIVS is used to detect any intermediate voltage caused by bridging and transistor stuck-on faults in the circuit. Detailed analyses of the proposed circuit have shown that the overall design not only can detect fault in the circuit under test, but also can detect or tolerate the fault in itself. An application example employing the BIVS as the output detection element to enhance the effectiveness of the totally selfchecking circuit is given

Keywords

CMOS logic circuits; automatic testing; design for testability; electric sensing devices; voltage measurement; CMOS built-in intermediate voltage sensor; bridging; code disjoint CMOS sensor; current sensor; intermediate voltage; level shifter; self-checking circuits; switching network; transistor stuck-on faults; CMOS logic circuits; CMOS technology; Circuit faults; Circuit testing; Electrical fault detection; Fault detection; Logic testing; Monitoring; Semiconductor device modeling; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Symposium, 1997. (ATS '97) Proceedings., Sixth Asian

Conference_Location

Akita

ISSN

1081-7735

Print_ISBN

0-8186-8209-4

Type

conf

DOI

10.1109/ATS.1997.643925

Filename

643925