Title :
A concurrent fault-detection scheme for FFT processors
Author :
Tsunoyama, Masahiro ; Uenoyama, Masahiko ; Kabasawa, Tatsuya
Author_Institution :
Niigata Inst. of Technol., Japan
Abstract :
This paper proposes a concurrent fault-detection scheme for FFT processors. In the scheme, fault detection is made by comparing the pair of outputs from butterfly units based on the FFT algorithm. The hardware overhead for the scheme is O(N) where N is the number of input data. This scheme requires no extra computations for locating a pair of faulty butterfly units, therefore, the scheme can be used for highly reliable real-time systems
Keywords :
computer testing; fast Fourier transforms; fault location; fault tolerant computing; integrated circuit testing; multiprocessing systems; reliability; signal processing; FFT algorithm; FFT processors; concurrent fault-detection; fast Fourier transform; reliable real-time systems; Circuit faults; Discrete Fourier transforms; Educational institutions; Electrical fault detection; Fault detection; Fault tolerance; Fuels; Hardware; Signal processing algorithms; Tellurium;
Conference_Titel :
Test Symposium, 1997. (ATS '97) Proceedings., Sixth Asian
Conference_Location :
Akita
Print_ISBN :
0-8186-8209-4
DOI :
10.1109/ATS.1997.643928
