• DocumentCode
    3220390
  • Title

    Recent testing of x band PPM klystrons at the Klystron Department at SLAC

  • Author

    Sprehn, D.

  • Author_Institution
    Stanford Linear Accelerator Center, Stanford Univ., CA, USA
  • fYear
    2004
  • fDate
    27-29 April 2004
  • Firstpage
    342
  • Lastpage
    343
  • Abstract
    Klystrons capable of driving accelerator sections in the Next Linear Collider have been developed at SLAC during the last decade. The latest specification for these tubes, as of June 2003, is shown. In addition to fourteen 50 MW solenoid focused devices, eight Periodic Permanent Magnet focused (PPM) devices have been tested including a 50 MW klystron, two diodes, an initial 500 kV 75 MW klystron, and 4 more 75 MW tubes. Testing of the first 75 MW device was completed in 1999, attaining 80 MW with 3 μs pulses but with a very low duty cycle. Beam transmission must be excellent in such devices in order to gain predictable and stable performance, reduce radiation intensity, keep thermal issues manageable and increase lifetime. Magnet quality and fabrication tolerances have been strong issues during tube development. Knowledge of the beam transmission during testing is difficult due to noise and calibration issues. Our later experiments have included drift tubes which are thermally mapped by including thermocouples into the design.
  • Keywords
    electron beam focusing; electron tube manufacture; electron tube testing; klystrons; 50 MW; 500 kV; 75 MW; Next Linear Collider; X band klystrons; calibration; driving accelerator sections; fabrication tolerances; mechanical construction; mechanical specification; periodic permanent magnet focused devices; solenoid focused devices; tube development; tube testing; very low duty cycle; Calibration; Diodes; Fabrication; Klystrons; Linear accelerators; Performance gain; Permanent magnets; Solenoids; Testing; Thermal management;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Vacuum Electronics Conference, 2004. IVEC 2004. Fifth IEEE International
  • Print_ISBN
    0-7803-8261-7
  • Type

    conf

  • DOI
    10.1109/IVELEC.2004.1316352
  • Filename
    1316352